STEM / EDS Configuration - Atmosphere

  The Atmosphere E-chip family of sample supports provides an unparalleled level of flexibility for your in situ gas environment experiments. Atmosphere experiments utilize a small and large E-chip that form the bottom and top of the closed-cell design, respectively.  Protochips offers specialized combinations of the bottom and top E-chips to optimize your imaging conditions whether you are imaging with TEM or STEM mode. Heating E-chips contain a durable ceramic heating membrane are uniquely calibrated for thermal accuracy, and all E-chips utilize an amorphous silicon nitride window that creates a strong barrier for containing gases with minimal beam scatter. When conducting STEM and EDS experiments, sample placement at the top of the closed cell is preferred in order to minimize beam scatter and maximize EDS counts per second (CPS).  The thickness of the gaseous layer is established through embedded spacers on the small E-chip. This spacer sets the minimum spacing between the two E-ch